Capture 3D is bringing their biennial Innovation Conference & Expo to Troy, Michigan from October 2nd – 4th. Serving as a showcase of Capture 3D’s specialty, the expo gathers together innovators and industry leaders with the latest in 3D measurement technology for advancing product development and manufacturing processes.
Panels and demonstrations will focus on applications of optical noncontact 3D metrology and how it eliminates unforeseen costs, improves product quality, optimizes manufacturing processes, and quickly solves quality issues.
“This is an opportunity for us to meet other industry partners, to build relationships and see how this technology is being proven and used in the industry,” said a metrology team-lead at the US Army and a repeat attendee to the conference. “Integrating blue light structured scanning into these operations is critical, not only for us to get it right the first time but for us to catch up to where industry is.”
After the welcome reception, the event holds training for GOM Inspect 2018 software, live technology demonstrations, breakout sessions for 3D metrology focused around industry-specific applications, and guest speakers. Previous speakers at the event included professionals from NASA, General Atomics, the Department of Defense, and metrology experts from GOM and Capture 3D.
Registration for the event is currently open, with early bird registration available until August 20th, and general registration closing on September 14th. Tickets are available for those that only want to attend the training or the conference, as well as tickets for both events.
Capture 3D is the exclusive North American distributor of GOM GmbH industrial 3D metrology systems.
