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Inventor of AFM-IR Technique to Receive Prestigious Award

March 18, 2014 Santa Barbara CA Anasys Instruments is pleased to announce that the inventor of the AFM-IR technique, Professor Alexandre Dazzi from the Universit├® Paris-Sud, is to receive the Ernst Abbe Memorial Award. The award is given by the New York Microscopy Society and will be presented at the 2014 Eastern Analytical Symposium and Exhibition being held November 17-19, Somerset, New Jersey, USA.

Professor Alexandre Dazzi, from the Laboratoire de Chimie Physique at the Universit├® Paris-Sud has been selected to receive the New York Microscopy Societys Ernst Abbe Award.Since its inception in 1973, 24 scientists have been recognizedincluding innovators such as Albert V. Crewe (inventor of Scanning Transmission Electron microscopy), Edwin H. Land (inventor of polaroid photography), Gerd Binning & Heinrich Rohrer (inventors of AFM). The Society presents this award to acknowledge the recipients outstanding contributions to imaging science and microscopy.

The Abbe Award will be presented to Professor Dazzi at a special Abbe Award Symposium within the 2014 Eastern Analytical Symposium and Exhibition (EAS). As the Abbe awardee, Professor Dazzi will present a paper on his work within the Abbe Award Symposium chaired by John A. Reffner, Professor of Forensic Science at John Jay College, CUNY.

Professor Dazzis invention has been commercialized by Anasys Instruments in Santa Barbara California with a product called nanoIR. In its second generation now, the nanoIR2 is a nanoscale material property measurement platform that combines atomic force microscopy (AFM) with IR spectroscopy, thermal and mechanical analysis. Dr. Craig Prater, CTO of Anasys added that We are delighted that Alexs groundbreaking innovation is being recognized by this prestigious honor. We frequently hear from customers and collaborators that AFM-IR allows them to perform measurements they cant achieve with any other technique. We are very grateful for Alexs work and celebrate his recognition.-